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Home / Submicron Surface Roughness Measurement

Submicron Surface Roughness Measurement

The LEXT OLS5100 laser microscope from Olympus guarantees measurement accuracy that simplify experiment workflows. The software’s several smart features minimize error with push-button scanning and analysis.

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Laser microscopes are essential equipment in manufacturing R&D and quality assurance due to their powerful capabilities: submicron 3D measurements with no sample preparation, non-contact areal roughness analysis and speed. However, some tasks, such as creating and managing an experiment plan and choosing the right objective lens, are time-consuming sources of potential error.

To provide the high levels of accuracy and precision required for sub-micron 3D observation and surface roughness measurement, the LEXT OLS5100 from Olympus Corp. of the Americas (Waltham, MA) offers guaranteed accuracy and precision (when calibrated by an Olympus technician and using LEXT objective lenses) via several features.

Smart Experiment Manager helps users manage the planning, acquisition and analysis phases of their experiments. The microscope scans samples according to a customized experiment plan generated by the software, helping to keep users from missing data or redoing work. During analysis, the software’s trend visualization tools make it easier for users to spot problems.

Smart Lens Advisor takes the guesswork out of selecting the right objective lens when measuring surface roughness. In three steps, the Advisor rates the objective lens based on the application so users know they are using the right objective.

Data acquisition simple is simple: Place a sample on the stage and press the start button. The microscope makes all necessary setting adjustments and acquires the data.

www.olympus-ims.com

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