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Flaw Detector Combines Multiple Features

OmniScan phased array ultrasonic testing (PAUT) instruments are known for power, reliability, and ease of use. Whether inspecting pipes, welds, pressure vessels, or composites, the OmniScan X3 flaw detector from Olympus enables users to complete their work efficiently and interpret flaws with confidence.

Posted: August 26, 2020

The OmniScan X3 flaw detector from Olympus combines the essential tools needed for phased array ultrasonic testing (PAUT) inspections with features that greatly facilitate setting up for an inspection and interpreting results. The entire scan plan can be created in one simple workflow.

The OmniScan X3 from Olympus Corp. (Waltham, MA) improves the entire inspection workflow from start to finish. Setting up for a job is faster and more efficient, while total focusing method (TFM) images collected through full matrix capture (FMC) give users more confidence in their decision-making. When an inspection is complete, software tools make analysis and reporting easier.

The flaw detector combines the essential tools needed for phased array ultrasonic testing (PAUT) inspections, such as TOFD; two UT channels; eight groups; and 16:64PR, 16:128PR and 32:128PR configurations*, with features including:

TFM/FMC with 64-element aperture support.

  • Improved phased array imaging, including a live TFM envelope feature.
  • Acoustic influence map (AIM) simulator for TFM mode.
  • 25GB file size.
  • Up to 1,024 × 1,024-pixel TFM reconstruction and four simultaneous, live TFM propagation modes.
  • Simplified user interface with onboard scan plan.
  • Wireless connectivity to the Olympus Scientific Cloud (OSC) makes it easy to keep the instrument’s software up to date.

The comprehensive onboard scan plan tool enables users to visualize the inspection, helping reduce the risk of errors. The entire scan plan, including the TFM zone, can be created in one simple workflow. Creating a setup is also faster with improved calibration tools and support for simultaneous probe and beam set configuration, onboard dual linear, matrix and dual matrix array creation, and automatic wedge verification.

Certified IP65 dustproof and water-resistant, the instrument’s high-quality images help make interpreting flaws more obvious. With TFM, users can produce geometrically correct images to confirm the characterization of flaws identified through conventional phased array techniques and obtain better images throughout the volume of a part. Additional features that enable outstanding images include a 16-bit A-scan, interpolation and smoothing, and a vivid 10.6-inch WXGA display that provides clarity and visibility in any light.

The instrument makes analysis and reporting faster, both onboard the instrument and on a PC. Integrated data-interpretation tools include:

Circumferential outside diameter (COD) TFM image reconstruction to facilitate interpretation and sizing of long seam weld indications.

Merged B-scan to facilitate the screening of phased array weld indications while keeping the workflow simple.

*The 16:64PR configuration limits the number of groups to 1 TOFD, 2 PA and 2 TFM.

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