Software
This category includes any free-standing or integrated software systems used for measurement or inspection in the manufacturing process. Software is typically used to automate mechanical processes, analyze and rate the quality of cutting tools, integrate with probes and product inspection equipment to translate data into centralized system, program CMMs, laser scanners, and laser printers, generate inspection schedules and reports, support mobile and/or offline inspections, and a variety of other applications. Many software platforms are customized to specific tasks, or to the needs of their users.
Achieve Zero Defects with Innovative Measurement and Inspection Solutions

Uncover hidden defects before downstream processes are impacted with the latest 3D scanners, powerful software packages and portable measurement devices.
Uncover hidden defects before downstream processes are impacted with the latest 3D scanners, powerful software packages and portable measurement devices.
Leading edge equipment, technologies and software provide a detailed look into the health and condition of cutting tools.
Software innovations add even more detail and automation to non-destructive CT inspection, which makes material and part performance evaluations easier, among other advantages.
A manufacturer’s ability to create a comprehensive, cost-effective digital thread is hindered by legacy and proprietary communications standards. Fortunately, the International Standards Organization is expected to approve the Quality Information Framework (QIF) by the end of the year.
Exact Metrology worked with artist Tom Tsuchiya to create relief figures of the 1869 Cincinnati Reds team.
Mitutoyo America Corp. releases the new LH600F/FG Height Gage, which is the latest model in the Mitutoyo Linear Height Gage line, and which features several added features and benefits.
Modern 3D metrology is becoming the eyes and ears of the production floor, bringing multiple advantages to the manufacturing world.
Marposs Corp.’s Aeroel D-Lab is able to capture a measurement within 1 second and with +.01 µm repeatability.