The 2.9-lb (1.32-kg) Vanta Element X-ray fluorescence (XRF) analyzer from Olympus Scientific Solutions Americas (Waltham, MA) provides the same stability and resolution as other Vanta models at a more affordable price point.
Powered by the company’s Axon ultra-low-noise, high-resolution signal-processing technology, the dual-core processer enables users to obtain material and grade identification in seconds and compare alloy grades on the analyzer’s screen. Built for use in demanding environments, the analyzers are IP54-rated for resistance to dust and moisture and built to pass a 4-ft drop test (MIL-STD-810G). For additional protection, a stainless steel faceplate is paired with a thick (50 µm) Kapton window that’s easily attached and removed for toolless window changes in the field. The analyzer performs continuously in temperatures from 14 degrees F to 113 degrees F (-10 degrees C to 45 degrees C).
Optional connectivity to the Olympus Scientific Cloud enables wireless data sharing and access to fleet management tools, Olympus mobile app, or your network. Industrial 1 GB microSD card stores results. Two USB ports facilitate data export. For added flexibility, the analyzer is compatible with accessories including the Vanta field stand, soil foot, probe shield, and holster.
Olympus Scientific Solutions Americas Inc., 48 Woerd Ave., #102, Waltham, MA 0245, 781-419-3900, www.olympus-ims.com.
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